Paper
6 December 2006 Modelling of 2D super-long-period multilayer gratings applied in spectral ellipsometry
Vlček Jaroslav, Pištora Jaromír, Postava Kamil, Yamaguchi Tomuo, Brings Reiner
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Proceedings Volume 5945, 14th Slovak-Czech-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics; 59450A (2006) https://doi.org/10.1117/12.638815
Event: 14th Slovak-Czech-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics, 2005, Nitra, Slovakia
Abstract
Dispersion of ellipsometrical angles analyzed using theoretical model as well as over measured data is presented. Binary multilayer grating is modeled via rigorous coupled wave method. The special attention is devoted to additional oxidation of inter-dot area and to an interaction of finite optical beam with super-long-period structure. The results are discussed in the relation to experimental data.
© (2006) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Vlček Jaroslav, Pištora Jaromír, Postava Kamil, Yamaguchi Tomuo, and Brings Reiner "Modelling of 2D super-long-period multilayer gratings applied in spectral ellipsometry", Proc. SPIE 5945, 14th Slovak-Czech-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics, 59450A (6 December 2006); https://doi.org/10.1117/12.638815
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KEYWORDS
Oxidation

Data modeling

Ellipsometry

Multilayers

Binary data

Diffraction

Diffraction gratings

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