Measurements Of Surface Scattering From Mirrored Surfaces Using A Triple Axis X-Ray Spectrometer

Finn E. Christensen; K. P. Singh; H. W. Schnopper

doi:10.1117/12.966569

14 July 1986 Measurements Of Surface Scattering From Mirrored Surfaces Using A Triple Axis X-Ray Spectrometer

Finn E. Christensen, K. P. Singh, H. W. Schnopper

Proceedings Volume 0597, X-Ray Instrumentation in Astronomy; (1986) https://doi.org/10.1117/12.966569
Event: 1985 International Technical Symposium/Europe, 1985, Cannes, France

Abstract

A triple axis X-ray spectrometer has been used to test the smoothness of mirrored surfaces. A perfect channel-cut Si or Ge crystal extracts Fe-ka radiation from a conventional X-ray tube. The radiation is incident on the test surface and the specularly reflected and scattered radiation from the surface is analyzed by another perfect channel-cut Si or Ge crystal. The channel-cut crystals provide an essentially "tailless" probe of the scattered radiation. The test surfaces in this study include three standard flats from the EXOSAT program, the AXAF-program and the ROSAT program, respectively, and test foils made in connection with the construction of a high throughput thin foil reflector telescope for the ESA X-ray Spectroscopy Mission XMM.

Citation Download Citation

Finn E. Christensen, K. P. Singh, and H. W. Schnopper "Measurements Of Surface Scattering From Mirrored Surfaces Using A Triple Axis X-Ray Spectrometer", Proc. SPIE 0597, X-Ray Instrumentation in Astronomy, (14 July 1986); https://doi.org/10.1117/12.966569

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