Paper
13 October 2005 Spectral technique for measuring the optical phase transfer function
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Abstract
A technique is presented for measuring the optical phase transfer function of optoelectronic devices for stimulus frequencies from 100 MHz up to the modulation bandwidth of the device. Using high-resolution optical spectra and a novel instrument setup that makes use of RF signal processing to obtain the stimulus signals, the change in phase of an optical signal is obtained as a function of a time-varying electrical stimulus for electrical-to-optical devices or an optical stimulus for optical-to-optical devices. In the technique, the modulation frequency of the stimulus can be varied over a wide range (e.g., 100 MHz to 10 GHz for a 10 Gb/s device). Thus the proposed technique complements low-frequency and stepped measurements of the optical phase transfer function. The technique is demonstrated by considering the change in phase of the output signal from an electroabsorption modulator as a function of the applied voltage.
© (2005) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
David J. Krause, Ning Cheng, and John C. Cartledge "Spectral technique for measuring the optical phase transfer function", Proc. SPIE 5970, Photonic Applications in Devices and Communication Systems, 59701Z (13 October 2005); https://doi.org/10.1117/12.628671
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KEYWORDS
Modulation

Phase transfer function

Modulators

Optoelectronic devices

Phase shift keying

Optical testing

Bandpass filters

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