Super resolution by using tilted wave illumination

C. Ferreira; V. Micó; Z. Zalevsky; P. García-Martínez; J. García

doi:10.1117/12.639716

14 December 2005 Super resolution by using tilted wave illumination

C. Ferreira, V. Micó, Z. Zalevsky, P. García-Martínez, J. García

Proceedings Volume 5972, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies II; 59720J (2005) https://doi.org/10.1117/12.639716
Event: Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies II, 2004, Bucharest, Romania

Abstract

Temporally restricted objects may be superresolved using the moving of two masks such as pinholes or gratings. The first one performs the encoding process of the input object and the second one is responsible for the decoding operation. This approach is efficient for exceeding the resolving capability beyond Abbes's limit of resolution but several problems exist in the system matching. We propose superresolution techniques based on the use of tilted wave illumination. In a first approach, the second grating used for the decoding operation is removed and substituted by a digital post-processing stage. In a second approach, the two masks are replaced by the use of a Vertical Cavity Surface Emitting Lasers (VCSEL) array. This VCSEL array provides a set of tilted waves at different angles and incoherent one to each other. By means of an interferometric recording process we ensure the transmission of several spatial frequency bands of the object's spectrum in parallel. After a reconstruction process, the resolution of any optical system can approach the natural λ/2 resolution limit. Unlike other interferometric superresolution techniques for this approach the exact reconstruction of the input object is obtained. Moreover, any desired synthetic coherent transfer function can be realized at ultra fast rates changing the electrical driving of the VCSEL array.

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C. Ferreira, V. Micó, Z. Zalevsky, P. García-Martínez, and J. García "Super resolution by using tilted wave illumination", Proc. SPIE 5972, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies II, 59720J (14 December 2005); https://doi.org/10.1117/12.639716

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KEYWORDS

Vertical cavity surface emitting lasers

Super resolution

Interferometry

Spatial frequencies

Fourier transforms

Diffraction gratings

Imaging systems

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