The technique of thin beam scan to measure the distributing of refraction ratio of section plane of polymer optical fiber

Hongying Zhou; Jiabu Chen; Gao Qiu

doi:10.1117/12.668416

20 January 2006 The technique of thin beam scan to measure the distributing of refraction ratio of section plane of polymer optical fiber

Hongying Zhou, Jiabu Chen, Gao Qiu

Author Affiliations +

Proceedings Volume 6027, ICO20: Optical Information Processing; 60274J (2006) https://doi.org/10.1117/12.668416
Event: ICO20:Optical Devices and Instruments, 2005, Changchun, China

Abstract

It is necessary to measure the section-plane-distribution of refractive index of prefabricated stick of polymer optical fiber (PSPOF) accurately, because it decides the transfer characteristic of polymer optical fiber (POF). Usually interferometer method, neat-field scan and focusing method are used in measurement. A new method of measurement, that is thin-beam-scan method, is described in this paper. When thin beam incident upon PSPOF, the light is converged for the PSPOF which act as columnar lens. After a series of refraction, light pass through PSPOF and exit from the other side of the fiber. We assume a distribution of section-plane-distribution of refractive index in PSPOF, then do the ray tracing calculation based on geometrical optics and get the theoretical location on the exit section plane of the fiber. At the same time we get the real exit location of light by experiment. We can construct a evaluation function with difference of the two results. And correct the assumption of the section-plane-distribution of refractive index in PSPOF by Monte-Carlo method until the evaluation function value limit to a small numerical value which means the theoretical result approach to the real distribution of refractive index.

Citation Download Citation

Hongying Zhou, Jiabu Chen, and Gao Qiu "The technique of thin beam scan to measure the distributing of refraction ratio of section plane of polymer optical fiber", Proc. SPIE 6027, ICO20: Optical Information Processing, 60274J (20 January 2006); https://doi.org/10.1117/12.668416

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members: $17.00

Non-members: $21.00 ADD TO CART

PROCEEDINGS
8 PAGES

DOWNLOAD PAPER SAVE TO MY LIBRARY

GET CITATION

RIGHTS & PERMISSIONS

Get copyright permission Get copyright permission on Copyright Marketplace

KEYWORDS

Refractive index

Refraction

Phase only filters

Polymer optical fibers

Charge-coupled devices

Ray tracing

Interfaces

Show All Keywords

Keywords/Phrases

Search In:

Publication Years