Paper
3 January 2006 Optical scanning devices based on PZT thick films formed by aerosol deposition method
Author Affiliations +
Proceedings Volume 6037, Device and Process Technologies for Microelectronics, MEMS, and Photonics IV; 60371S (2006) https://doi.org/10.1117/12.638489
Event: Microelectronics, MEMS, and Nanotechnology, 2005, Brisbane, Australia
Abstract
High-speed metal-based optical microscanning devices with low production cost and simple fabrication process wre successfully fabricated by direct deposition of piezoelectric materials using the aerosol deposition method (ADM) onto the micro-structured metal scanner frame. Large optical scanning angle of 35° at high resonance frequency of 23.6 kHz was achieved in ambient air without vacuum package. The scanner is applicable to SVGA high-resolution display of 800 x 600 or more. This method is a powerful tool for realizing ceramic integration with metal components.
© (2006) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jae-Hyuk Park, Jun Akedo, Maxim Lebedev, and Harumichi Sato "Optical scanning devices based on PZT thick films formed by aerosol deposition method", Proc. SPIE 6037, Device and Process Technologies for Microelectronics, MEMS, and Photonics IV, 60371S (3 January 2006); https://doi.org/10.1117/12.638489
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KEYWORDS
Scanners

Mirrors

Ferroelectric materials

Optical scanning

Aerosols

Deposition processes

Metals

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