Photoelectrical properties of polyaniline/polyimide complex thin film

Jianbang Zheng; Chaoqi Hou; Jia Liu; Ju Ren; Jianlin Zhao

doi:10.1117/12.674201

9 June 2006 Photoelectrical properties of polyaniline/polyimide complex thin film

Jianbang Zheng, Chaoqi Hou, Jia Liu, Ju Ren, Jianlin Zhao

Proceedings Volume 6149, 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies; 61490E (2006) https://doi.org/10.1117/12.674201
Event: 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies, 2005, Xian, China

Abstract

Using pyromellitic dianhydride (PMDA) and bis(4-aminophenyl) ether (ODA) as monomer materials, the polyamic acid (PAA), a precursor of polyimide (PI), was synthesized. PAn was doped and modified with the polyamic acid by solution mixing method, and the modified PAn/PAA blend with good solubility and forming-film was obtained. Then uniform PAn/PI complex thin film with good forming-film and thermo-stability can be prepared by solvent casting and followed by thermal imidization process at the temperature of 150^oC-250^oC for 60 min. Conductance experiments showed the surface conductivity of PAn/PI thin films can raise to 10^-5S from 10^-10S and change with the increase of the content of PAA. IR and UV-vis spectra showed that it has a chemical doping reaction between PAn and PAA during mixing, and the absorption of PAn/PI complex films in UV-vis region appears red shift and the peak shape becomes broad. The degenerate four-wave mixing experimental results showed that the third-order optical nonlinear susceptibility χ⁽³⁾ of PAn/PI thin films can be markedly enhanced and the maximum χ⁽³⁾ can reach 8.85×10^-10esu, which presents good third-order nonlinear property.

Citation Download Citation

Jianbang Zheng, Chaoqi Hou, Jia Liu, Ju Ren, and Jianlin Zhao "Photoelectrical properties of polyaniline/polyimide complex thin film", Proc. SPIE 6149, 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies, 61490E (9 June 2006); https://doi.org/10.1117/12.674201

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