Optical properties and electrochromic performance tungsten trioxide thin films doped with terbium prepared by magnetron sputtering deposition

Linfeng Yang; Zuli Liu; Kailun Yao

doi:10.1117/12.674279

9 June 2006 Optical properties and electrochromic performance tungsten trioxide thin films doped with terbium prepared by magnetron sputtering deposition

Linfeng Yang, Zuli Liu, Kailun Yao

Author Affiliations +

Proceedings Volume 6149, 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies; 61492B (2006) https://doi.org/10.1117/12.674279
Event: 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies, 2005, Xian, China

Abstract

In this work, electrochromic tungsten oxide thin films doped with terbium were deposited by radio frequency magnetron sputtering deposition. The samples were analyzed with scanning electron microscopy (SEM), atomic force microscopy (AFM) and x-ray diffraction (XRD). The films were amorphous and the thickness of the films is about 250 nm. From the result of AFM, the WO₃ films doped with terbium are porous and the sample doped with 1.95% Tb has more porosities than undoped sample. Cyclic voltammetry experiments were performed to investigate the influence of terbium content on the electrochromic performance of the films. When the terbium content is equal to 1.95%, the cell capacity owns the best electrochromic capability. Measurement of optical transmission measurement for W-Tb-O thin films was carried out by a double-beam UV-VIS-NIR spectrophotometer with a wavelength range from 380 nm to 900 nm. In the different wavelength ranges, the films have different transmittance changes for the bleaching and colored state.

Citation Download Citation

Linfeng Yang, Zuli Liu, and Kailun Yao "Optical properties and electrochromic performance tungsten trioxide thin films doped with terbium prepared by magnetron sputtering deposition", Proc. SPIE 6149, 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies, 61492B (9 June 2006); https://doi.org/10.1117/12.674279

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available