Paper
7 July 2006 Design of CMOS-APS circuits for mixed image processing and analysis of their transfer characteristics
Author Affiliations +
Abstract
CMOS APS Active Pixel Sensors (APS) are very important among others because of their possible technical innovations leading to ultra-low power image acquisition or efficient on-chip image preprocessing. The design of the novel CMOS is presented in the first part of the paper. The general principle of analog interpixel subtraction is described. The edge detection algorithm for analog realization and patented focal plane circuits for analog image preprocessing (signals subtraction, addition, and edge detection) are described. Implementation of the image processing tasks (focal plane preprocessing and subsequent image processing) can be done effectively only with the consideration of known transfer characteristics of the imager itself. In the second part of the paper we present analysis of those characteristics. Geometrical Point Spread Function (PSF) depends on the certain geometric shape of active area in the particular design of CMOS APS. In this paper the concept of Modulation Transfer Function (MTF) analysis is generalized to be applicable to the sampled structures of CMOS APS. Recalling theoretical results we have analytically derived the detector MTF in the closed form for some special active area shapes.
© (2006) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Evgeniya N. Serova and Karel Fliegel "Design of CMOS-APS circuits for mixed image processing and analysis of their transfer characteristics", Proc. SPIE 6164, Saratov Fall Meeting 2005: Coherent Optics of Ordered and Random Media VI, 61640N (7 July 2006); https://doi.org/10.1117/12.695266
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KEYWORDS
Modulation transfer functions

Sensors

Imaging systems

Image processing

Image sensors

Edge detection

Analog electronics

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