Paper
4 April 2006 Nanomaterials produced by laser ablation techniques. Part II: High spatially resolved nondestructive characterization of nanostructures
Bernd Koehler, Paul Murray, Eunsung Shin, Sebastian Lipfert, Juergen Schreiber
Author Affiliations +
Abstract
We studied nanoparticles by several high resolution microscopic methods as scanning electron microscopy (SEM), transmission electron microscopy (TEM) and scanning probe techniques especially atomic force microscopy (AFM) in contact and non-contact mode. While AFM in non-contact mode gives reliable information for 100 nm range nanoparticles it fails for smaller particles, showing lack of reproducibility. TEM and SEM prove to be reliable. By SEM imaging the agglomeration behavior and the structure of agglomerates are discussed in detail.
© (2006) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Bernd Koehler, Paul Murray, Eunsung Shin, Sebastian Lipfert, and Juergen Schreiber "Nanomaterials produced by laser ablation techniques. Part II: High spatially resolved nondestructive characterization of nanostructures", Proc. SPIE 6175, Testing, Reliability, and Application of Micro- and Nano-Material Systems IV, 61750C (4 April 2006); https://doi.org/10.1117/12.660463
Lens.org Logo
CITATIONS
Cited by 3 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Scanning electron microscopy

Particles

Transmission electron microscopy

Atomic force microscopy

Nanoparticles

Scanning tunneling microscopy

Diffusion

Back to Top