Paper
15 June 2006 Improved x-ray CCD response at very low x-ray energies
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Abstract
We report laboratory measurements of the response of a back-illuminated, X-ray photon-counting charge-coupled device at X-ray energies between 80 and 500 eV. The detector tested, which is similar to one currently in orbit aboard the Suzaku X-ray Imaging Spectrometer, has been treated with the chemisorption charging process developed by Lesser and colleagues. We report energy scale linearity and spectral resolution measurements in this energy band, which spans the silicon LII,III absorption edge, and demonstrate useful spectral resolution at energies as low as 83 eV with our single-read-per-pixel system. We discuss the factors currently limiting device performance and briefly consider the challenges of exploiting this capability in future astronomical instruments.
© (2006) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
M. W. Bautz, S. E. Kissel, B. J. LaMarr, and G. Y. Prigozhin "Improved x-ray CCD response at very low x-ray energies", Proc. SPIE 6266, Space Telescopes and Instrumentation II: Ultraviolet to Gamma Ray, 62662P (15 June 2006); https://doi.org/10.1117/12.670847
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Cited by 4 scholarly publications.
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KEYWORDS
Sensors

Spectral resolution

X-rays

Electrons

Charge-coupled devices

Back illuminated sensors

Silicon

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