Paper
15 June 2006 Development of hybridized focal plane technologies
Michael Lesser, David Ouellette
Author Affiliations +
Abstract
Large area focal planes for the next generation of astronomical instruments require very flat imaging surfaces (< 10 μm peak-valley) over significant sizes (20 - 100 cm), accurate alignment of detector height, stable operation at low temperature, and fully-buttable packaging with large I/O requirements to connect multiple amplifiers per detector. These requirements are often mutually exclusive and therefore difficult to obtain in a single focal plane. In this paper we discuss the hybridization or flip chip bonding technique and associated focal plane mounting methods to achieve these goals. Specifically, we describe a technique to hybridize CCD detectors onto high thermal conductivity ceramic with vias that lead to the I/O signals underneath the detectors. Packaging methods to mount such devices with a total flatness non-uniformity of less than 10 microns are presented. The requirements of achieving sub-5 microns flatness are also discussed.
© (2006) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Michael Lesser and David Ouellette "Development of hybridized focal plane technologies", Proc. SPIE 6276, High Energy, Optical, and Infrared Detectors for Astronomy II, 627603 (15 June 2006); https://doi.org/10.1117/12.670808
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CITATIONS
Cited by 6 scholarly publications.
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KEYWORDS
Sensors

Charge-coupled devices

Silicon

Ceramics

Image processing

Epoxies

Imaging systems

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