Stray light in packaged detectors

D. M. Waters; M. M. Blouke; A. Harwit; D. Heath

doi:10.1117/12.678094

7 September 2006 Stray light in packaged detectors

D. M. Waters, M. M. Blouke, A. Harwit, D. Heath

Proceedings Volume 6291, Optical Systems Degradation, Contamination, and Stray Light: Effects, Measurements, and Control II; 62910U (2006) https://doi.org/10.1117/12.678094
Event: SPIE Optics + Photonics, 2006, San Diego, California, United States

Abstract

Ghosting between detector and window surfaces is a common source of stray light in packaged detectors. Simple formulas are presented for predicting window ghost characteristics. Stray light paths in silicon detectors, which are semi-transparent to near-infrared light, can involve non-optical structures deep within the device. Methods for identifying subsurface stray light paths are presented.

Citation Download Citation

D. M. Waters, M. M. Blouke, A. Harwit, and D. Heath "Stray light in packaged detectors", Proc. SPIE 6291, Optical Systems Degradation, Contamination, and Stray Light: Effects, Measurements, and Control II, 62910U (7 September 2006); https://doi.org/10.1117/12.678094

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