Paper
20 October 2006 A novel Alt-PSM structure: isn't this an embedded Atten-PSM?
S. Nakao, K. Hosono, S. Maejima, K. Narimatsu, T. Hanawa, K. Suko
Author Affiliations +
Abstract
A novel mask structure for an alternating aperture phase shift mask (Alt-PSM) to cut mask cost is proposed. By a mask with structure of an embedded attenuating phase shift mask (Atten-PSM), an Alt-PSM for an isolated line formation can be well fabricated. Fine image quality is confirmed with optical image calculations. Moreover, concept of this novel mask is proved by a preliminary experiment. In conclusion, this novel mask can replace conventional Alt-PSM for logic devices, resulting in considerable cut of mask cost.
© (2006) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
S. Nakao, K. Hosono, S. Maejima, K. Narimatsu, T. Hanawa, and K. Suko "A novel Alt-PSM structure: isn't this an embedded Atten-PSM?", Proc. SPIE 6349, Photomask Technology 2006, 63492Q (20 October 2006); https://doi.org/10.1117/12.692820
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Photomasks

Critical dimension metrology

Phase shifts

Image transmission

Chromium

Quartz

Printing

RELATED CONTENT

Impact of alternating phase shift mask quality on 100 nm...
Proceedings of SPIE (January 22 2001)
Die-to-die inspection of phase-shifting masks
Proceedings of SPIE (February 15 1994)
Metrology test reticles for advanced optical lithography
Proceedings of SPIE (December 07 1994)
Hard phase shifting masks for the 65 nm node ...
Proceedings of SPIE (May 28 2004)

Back to Top