Properties of conductive PEDOT:PSS films deposited by resonant infrared laser ablation

S. L. Johnson; H. K. Park; R. F. Haglund Jr.

doi:10.1117/12.701319

13 March 2007 Properties of conductive PEDOT:PSS films deposited by resonant infrared laser ablation

S. L. Johnson, H. K. Park, R. F. Haglund Jr.

Proceedings Volume 6458, Photon Processing in Microelectronics and Photonics VI; 64580U (2007) https://doi.org/10.1117/12.701319
Event: Lasers and Applications in Science and Engineering, 2007, San Jose, California, United States

Abstract

Thin films of the conducting polymer poly(3,4-ethylenedioxy-thiophene):poly(styrenesulfonate) (PEDOT:PSS) were deposited by resonant infrared laser ablation. The PEDOT:PSS was frozen in various matrix solutions and deposited using a tunable, mid-infrared free-electron laser (FEL). The films so produced exhibited morphologies and conductivities that were highly dependent on the solvent matrix and laser irradiation wavelength used. When deposited from a native solution (5% by weight in water), as in matrix-assisted pulsed laser evaporation (MAPLE), films were rough and electrically insulating. When the matrix included other organic "co-matrices" that were doped into the solution prior to freezing, however, the resulting films were smooth and exhibited good electrical conductivity (0.2 S/cm), but only when the ablation was carried out at certain wavelengths. These results highlight the importance of the matrix/solute and matrix/laser interactions in the ablation process.

Citation Download Citation

S. L. Johnson, H. K. Park, and R. F. Haglund Jr. "Properties of conductive PEDOT:PSS films deposited by resonant infrared laser ablation", Proc. SPIE 6458, Photon Processing in Microelectronics and Photonics VI, 64580U (13 March 2007); https://doi.org/10.1117/12.701319

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