Noise optimization of an active pixel sensor for real-time digital x-ray fluoroscopy

M. H. Izadi; K. S. Karim

doi:10.1117/12.717545

8 June 2007 Noise optimization of an active pixel sensor for real-time digital x-ray fluoroscopy

M. H. Izadi, K. S. Karim

Proceedings Volume 6600, Noise and Fluctuations in Circuits, Devices, and Materials; 66000Y (2007) https://doi.org/10.1117/12.717545
Event: SPIE Fourth International Symposium on Fluctuations and Noise, 2007, Florence, Italy

Abstract

In this paper, we derive the input referred noise in terms of the on-pixel transistor device dimensions of the main noise sources of our array, namely, the flicker noise of the pixel thin-film transistors (TFTs), and the reset noise. Theoretical calculations and simulation results show that it is desirable to minimize the amplifier TFT gate dimensions, L₁ and W₁, and to maximize the read-out TFT gate width, W₂. Noise curves are presented as a function of transistor dimensions, allowing the designer to choose appropriate device dimensions when designing flat-panel imaging circuits. In addition, it is demonstrated how the optimal amplifier TFT gate width, W₁, for the lowest-noise design, changes as a function of the extraneous sense node capacitance. The noise simulations indicate that with proper device dimension design, it is possible to achieve sub-500 electron input referred noise performance.

Citation Download Citation

M. H. Izadi and K. S. Karim "Noise optimization of an active pixel sensor for real-time digital x-ray fluoroscopy", Proc. SPIE 6600, Noise and Fluctuations in Circuits, Devices, and Materials, 66000Y (8 June 2007); https://doi.org/10.1117/12.717545

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