Paper
19 February 2008 Image analyzing of patterns in dielectric barrier discharge
Author Affiliations +
Proceedings Volume 6625, International Symposium on Photoelectronic Detection and Imaging 2007: Related Technologies and Applications; 66250O (2008) https://doi.org/10.1117/12.790842
Event: International Symposium on Photoelectronic Detection and Imaging: Technology and Applications 2007, 2007, Beijing, China
Abstract
The images of square pattern, square superlattice pattern, and hexagonal pattern observed in dielectric barrier discharge are processed to get the exactitude binary images for further investigation. By using spatial correlation function, it is found that both of square and hexagonal patterns show perfect structures, and the square superlattice pattern exhibits an interleaving of two perfect squares with the same wavelength including large and small spots respectively. Furthermore, angular spectral distribution is used to study pattern development. It shows that, square and hexagonal patterns are formed with single modes respectively, while square superlattice pattern is governed by a three wave resonance.
© (2008) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Han Yue, Lifang Dong, Yafeng He, Weili Fan, and Weili Liu "Image analyzing of patterns in dielectric barrier discharge", Proc. SPIE 6625, International Symposium on Photoelectronic Detection and Imaging 2007: Related Technologies and Applications, 66250O (19 February 2008); https://doi.org/10.1117/12.790842
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KEYWORDS
Superlattices

Correlation function

Image analysis

Image processing

Dielectrics

Binary data

Software

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