Method for characterization and simulation of non-axisymmetric aspheric rough surface

Y. F. Peng; Y. B. Guo

doi:10.1117/12.783126

14 November 2007 Method for characterization and simulation of non-axisymmetric aspheric rough surface

Y. F. Peng, Y. B. Guo

Proceedings Volume 6722, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies; 672225 (2007) https://doi.org/10.1117/12.783126
Event: 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Large Mirrors and Telescopes, 2007, Chengdu, China

Abstract

This paper presents a method for characterization and simulation of the non-axisymmetric aspheric rough surface. With this characterization procedure, simulation of the rough surface is simplified by decomposing the rough surface into two parts, which are the non-axisymmetric aspheric surface and the only rough component without the ideal surface. Then each component of the divided surface is simulated individually. The rough surface exhibits self-affinity and the fractal number D can be associated with any profile and is scale-invariant, and then the rough surface component is simulated with the Weierstrass-Mandelbrot fractal function. An example for simulating a non-axisymmetric and aspheric rough surface is performed and the flexibility of this characterization method is also discussed.

Citation Download Citation

Y. F. Peng and Y. B. Guo "Method for characterization and simulation of non-axisymmetric aspheric rough surface", Proc. SPIE 6722, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies, 672225 (14 November 2007); https://doi.org/10.1117/12.783126

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