Paper
15 November 2007 Accuracy improvement for 3D shape measurement system based on gray-code and phase-shift structured light projection
Xiaobo Chen, Juntong Xi, Ye Jin
Author Affiliations +
Proceedings Volume 6788, MIPPR 2007: Pattern Recognition and Computer Vision; 67882C (2007) https://doi.org/10.1117/12.751206
Event: International Symposium on Multispectral Image Processing and Pattern Recognition, 2007, Wuhan, China
Abstract
Accuracy is one of the most important features for a 3D shape measurement system based on gray-code and phase-shift structured light projection and it requires accurate modeling and calibration of the camera and projector that consist of the system. In this paper, a new method is proposed to reconstruct the 3D object without the inverse projector model, thus make it possible to use a more accurate projector model considering high to 4th order radial and tangential lens distortion. Moreover, we propose a new system calibration method which can calibrate the camera and projector simultaneously based on the same reference points to eliminate the disadvantage of the conventional two-step calibration methods that the accuracy of the projector calibration is always influenced by the camera calibration error. The experiments compare the performance of our proposed model and calibration method with the conventional ones and the results are presented.
© (2007) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Xiaobo Chen, Juntong Xi, and Ye Jin "Accuracy improvement for 3D shape measurement system based on gray-code and phase-shift structured light projection", Proc. SPIE 6788, MIPPR 2007: Pattern Recognition and Computer Vision, 67882C (15 November 2007); https://doi.org/10.1117/12.751206
Lens.org Logo
CITATIONS
Cited by 3 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Projection systems

Cameras

Calibration

3D metrology

3D modeling

Imaging systems

Distortion

Back to Top