Accelerated life test for high-power white LED based on spectroradiometric measurement

Haiping Shen; Jiangen Pan; Huajun Feng

doi:10.1117/12.755708

4 January 2008 Accelerated life test for high-power white LED based on spectroradiometric measurement

Haiping Shen, Jiangen Pan, Huajun Feng

Proceedings Volume 6841, Solid State Lighting and Solar Energy Technologies; 684104 (2008) https://doi.org/10.1117/12.755708
Event: Photonics Asia 2007, 2007, Beijing, China

Abstract

We implement an accelerated life test for the high-power white LEDs based on spectroradiometric measurement. The luminous flux degradation performances are investigated at both the rated current of 350mA and a higher current of 500mA. The average lifetime of the LEDs is 7057 hours at 350mA and 3508 hours at 500mA. The variations of the color of the white LEDs are studied. The color of the low quality white LEDs changes greatly, while the high quality white LEDs keep their color stable. The degradation performances of the chip and phosphor are studied separately. The quantum efficiency of the phosphor becomes lower from 350mA to 500mA current supply. The LED chip degrades faster than the phosphor during the 500mA high current aging. The luminous flux increase and the peak wavelength shift from 350mA to 500mA current supply are found to be useful lifetime indicating parameters that correlate well to the reliability of the high-power white LEDs.

Citation Download Citation

Haiping Shen, Jiangen Pan, and Huajun Feng "Accelerated life test for high-power white LED based on spectroradiometric measurement", Proc. SPIE 6841, Solid State Lighting and Solar Energy Technologies, 684104 (4 January 2008); https://doi.org/10.1117/12.755708

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