Paper
25 April 2008 Influence of the incident angle in the performance of LCoS displays
Author Affiliations +
Abstract
Liquid Crystal on Silicon (LCoS) displays can be very useful in numerous optical applications due to some technical features of these devices, like the large fill factor and resolution. Here, we have developed a study related to the performance of the LCoS displays. It has been demonstrated that the LCoS display produces certain amount of depolarized light and the Mueller-Stokes formalism has been required for a full polarimetric characterization. In a previous paper we obtained the experimental Mueller matrix of the LCoS display as a function of the addressed gray level, at the very small angle of 2 degrees between the incident beam and the LCoS display normal, and for the wavelength of 633 nm. In the present paper we extend this study to different angles of incidence in order to analyze the influence of this parameter on the performance of the LCoS display. We also analyze the influence of the angle of incidence on the degree of polarization of the reflected beam. A comparison between the obtained results is presented in this paper.
© (2008) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Angel Lizana, Nuria Martin, Elena Fernandez, Andrés Márquez, Ignacio Moreno, Claudio Iemmi, Juan Campos, and María J. Yzuel "Influence of the incident angle in the performance of LCoS displays", Proc. SPIE 6994, Photon Management III, 69940J (25 April 2008); https://doi.org/10.1117/12.783812
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Liquid crystal on silicon

LCDs

Polarization

Wave plates

Polarimetry

Mueller matrices

Polysomnography

RELATED CONTENT

Broadband (UV-VIS-NIR) Mueller matrix polarimeter
Proceedings of SPIE (September 09 2011)
Precision polarimetry of optical components (Invited Paper)
Proceedings of SPIE (October 20 1992)
Advances in polarization metrology
Proceedings of SPIE (November 06 2003)
Extending optimization to active Mueller polarimeters
Proceedings of SPIE (September 25 2002)

Back to Top