Directional reflectance approach for emissivity estimation

M. Danov; D. Stoyanov; D. Petkov

doi:10.1117/12.822514

19 December 2008 Directional reflectance approach for emissivity estimation

M. Danov, D. Stoyanov, D. Petkov

Proceedings Volume 7027, 15th International School on Quantum Electronics: Laser Physics and Applications; 702713 (2008) https://doi.org/10.1117/12.822514
Event: 15th International School on Quantum Electronics: Laser Physics and Applications, 2008, Bourgas, Bulgaria

Abstract

In this communication we present our first experimental results related to the measurement of the directional reflectance of some rock and mineral samples in the thermal infrared (TIR) band. A simplified experimental set-up is developed to assess the rock emissivity by means of sample reflectance data, measured at several view angles with respect to the normal to the studied surface and comparison with Lambertian surface. The experimental data have shown that most samples exhibiting a naturally rough surface reflect diffusively (close to Lambertian) the irradiating light. Their emissivity can be estimated using the measured values of the directional reflectance. Exceptions from the diffusion reflectance are made by some smoothly sawed dense samples which exhibit higher portion of specular reflection. The presented results could be of importance for the thermal remote sensing method applications, where the emissivity data are deduced from the measurement of the reflectivity of the objects.

Citation Download Citation

M. Danov, D. Stoyanov, and D. Petkov "Directional reflectance approach for emissivity estimation", Proc. SPIE 7027, 15th International School on Quantum Electronics: Laser Physics and Applications, 702713 (19 December 2008); https://doi.org/10.1117/12.822514

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