Paper
22 September 2008 Focused beam powder diffraction with polycapillary and curved crystal optics
Author Affiliations +
Abstract
Focusing x-ray optics can be used to increase the intensity onto small samples, greatly reducing the data collection time for powder diffraction. Typically, the beam convergence is restricted to avoid loss of resolution since the focused beams broaden the resulting powder diffraction rings. However, the resolution, as defined by the uncertainty in peak location, can be much less than the peak width. Two types of x-ray optics, polycapillary and doubly curved crystals, were used to focus x rays onto standard inorganic powder diffraction samples. Comparisons were made of system resolution and diffracted beam intensity using low power microfocus sources.
© (2008) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ayhan Bingölbali, Wei Zhou, Dip N. Mahato, and C. A. MacDonald "Focused beam powder diffraction with polycapillary and curved crystal optics", Proc. SPIE 7077, Advances in X-Ray/EUV Optics and Components III, 70770M (22 September 2008); https://doi.org/10.1117/12.795323
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CITATIONS
Cited by 3 scholarly publications.
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KEYWORDS
Diffraction

Sensors

Nickel

X-ray optics

Calibration

Crystal optics

Copper

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