Diamond detectors for x-ray spectroscopy

P. Allegrini; M. Girolami; P. Calvani; G. Conte; S. Salvatori; E. Spiriti; V. Ralchenko

doi:10.1117/12.793368

3 September 2008 Diamond detectors for x-ray spectroscopy

P. Allegrini, M. Girolami, P. Calvani, G. Conte, S. Salvatori, E. Spiriti, V. Ralchenko

Proceedings Volume 7077, Advances in X-Ray/EUV Optics and Components III; 70771P (2008) https://doi.org/10.1117/12.793368
Event: Optical Engineering + Applications, 2008, San Diego, California, United States

Abstract

Polycrystalline diamond detector prototypes suitable for x-ray spectroscopy were realized and tested. Thick diamond specimens, mechanically polished to reduce the surface roughness, were selected for prototypes development. Noble metal contacts were deposited on both faces, whereas multistrip structures were defined by photolithography on the growth face only with the aim of reducing the coupling capacitances and to allow characterization tests either in planar or sandwich configuration. Leakage currents as low as 20 pA at 500 V were measured on a 270μm thick device. The x-ray sensitivity was tested monitoring the photocurrent as a function of the applied voltage under continuous 8.05 keV Cu Kα irradiation. Studies in pulsed mode were also performed by using a commercial miniature x-ray source. Pulse height distributions were carried out with a system composed of a charge-sensitive preamplifier and a digital pulse processor multi-channel analyzer. Analysis was carried out around Ta Lα and Cu Kα characteristic lines. Realized prototypes were able to resolve such two characteristic lines only 90 eV apart. Energy resolutions better than 3% have been evaluated for one of the prototype at 8.14 keV. Such features address very good energy resolving capabilities and the suitability of polished polycrystalline diamond in x-ray spectroscopy.

Citation Download Citation

P. Allegrini, M. Girolami, P. Calvani, G. Conte, S. Salvatori, E. Spiriti, and V. Ralchenko "Diamond detectors for x-ray spectroscopy", Proc. SPIE 7077, Advances in X-Ray/EUV Optics and Components III, 70771P (3 September 2008); https://doi.org/10.1117/12.793368

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