Dependence of adaptive cross-correlation algorithm performance on the extended scene image quality

Erkin Sidick

doi:10.1117/12.793005

26 August 2008 Dependence of adaptive cross-correlation algorithm performance on the extended scene image quality

Erkin Sidick

Proceedings Volume 7093, Advanced Wavefront Control: Methods, Devices, and Applications VI; 70930G (2008) https://doi.org/10.1117/12.793005
Event: Optical Engineering + Applications, 2008, San Diego, California, United States

Abstract

Recently, we reported an adaptive cross-correlation (ACC) algorithm to estimate with high accuracy the shift as large as several pixels between two extended-scene sub-images captured by a Shack-Hartmann wavefront sensor. It determines the positions of all extended-scene image cells relative to a reference cell in the same frame using an FFT-based iterative image-shifting algorithm. It works with both point-source spot images as well as extended scene images. We have demonstrated previously based on some measured images that the ACC algorithm can determine image shifts with as high an accuracy as 0.01 pixel for shifts as large 3 pixels, and yield similar results for both point source spot images and extended scene images. The shift estimate accuracy of the ACC algorithm depends on illumination level, background, and scene content in addition to the amount of the shift between two image cells. In this paper we investigate how the performance of the ACC algorithm depends on the quality and the frequency content of extended scene images captured by a Shack-Hatmann camera. We also compare the performance of the ACC algorithm with those of several other approaches, and introduce a failsafe criterion for the ACC algorithm-based extended scene Shack-Hatmann sensors.

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Erkin Sidick "Dependence of adaptive cross-correlation algorithm performance on the extended scene image quality", Proc. SPIE 7093, Advanced Wavefront Control: Methods, Devices, and Applications VI, 70930G (26 August 2008); https://doi.org/10.1117/12.793005

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KEYWORDS

Image quality

Error analysis

Cameras

Wavefront sensors

Image analysis

Signal to noise ratio

Image processing

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