Localized contourlet features in vehicle make and model recognition

I. Zafar; E. A. Edirisinghe; B. S. Acar

doi:10.1117/12.805878

2 February 2009 Localized contourlet features in vehicle make and model recognition

I. Zafar, E. A. Edirisinghe, B. S. Acar

Author Affiliations +

Proceedings Volume 7251, Image Processing: Machine Vision Applications II; 725105 (2009) https://doi.org/10.1117/12.805878
Event: IS&T/SPIE Electronic Imaging, 2009, San Jose, California, United States

Abstract

Automatic vehicle Make and Model Recognition (MMR) systems provide useful performance enhancements to vehicle recognitions systems that are solely based on Automatic Number Plate Recognition (ANPR) systems. Several vehicle MMR systems have been proposed in literature. In parallel to this, the usefulness of multi-resolution based feature analysis techniques leading to efficient object classification algorithms have received close attention from the research community. To this effect, Contourlet transforms that can provide an efficient directional multi-resolution image representation has recently been introduced. Already an attempt has been made in literature to use Curvelet/Contourlet transforms in vehicle MMR. In this paper we propose a novel localized feature detection method in Contourlet transform domain that is capable of increasing the classification rates up to 4%, as compared to the previously proposed Contourlet based vehicle MMR approach in which the features are non-localized and thus results in sub-optimal classification. Further we show that the proposed algorithm can achieve the increased classification accuracy of 96% at significantly lower computational complexity due to the use of Two Dimensional Linear Discriminant Analysis (2DLDA) for dimensionality reduction by preserving the features with high between-class variance and low inter-class variance.

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I. Zafar, E. A. Edirisinghe, and B. S. Acar "Localized contourlet features in vehicle make and model recognition", Proc. SPIE 7251, Image Processing: Machine Vision Applications II, 725105 (2 February 2009); https://doi.org/10.1117/12.805878

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