Paper
25 August 2009 Measuring the radius of curvature of a spherical surface with diffraction method
Shiqun Hua, Ying Luo
Author Affiliations +
Proceedings Volume 7375, ICEM 2008: International Conference on Experimental Mechanics 2008; 73754T (2009) https://doi.org/10.1117/12.839319
Event: International Conference on Experimental Mechanics 2008 and Seventh Asian Conference on Experimental Mechanics, 2008, Nanjing, China
Abstract
A new diffraction method for measuring the radius of curvature of a convex spherical surface with a large radius is proposed. It is based on measuring the diffraction intensity profiles produced by a designed slit. This diffraction slit is built up using two straight edges. The upper straight edge remains fixed and the lower one is located on the spherical surface, so that the slit width can be modified with moving the lower straight edge on the spherical surface of a sample. The diffraction patterns are captured by a line CCD, and the extremum positions can be ascertained accurately through applying least-square fitting for the intensity distribution curves. By establishing the relation between the displacements of the lower edge in two mutual perpendicular directions and the radius of curvature of the sample, the radius of curvature of the test spherical surface is obtained. Experimental demonstration of the diffraction method on a spherical surface is performed.
© (2009) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Shiqun Hua and Ying Luo "Measuring the radius of curvature of a spherical surface with diffraction method", Proc. SPIE 7375, ICEM 2008: International Conference on Experimental Mechanics 2008, 73754T (25 August 2009); https://doi.org/10.1117/12.839319
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Cited by 2 scholarly publications.
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KEYWORDS
Diffraction

Spherical lenses

Charge-coupled devices

Image processing

Calibration

CCD cameras

Image processing software

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