Study of superficial stress gradients by computer simulation and x-ray diffraction experiment

Joaquim T. Assis; Vladimir I. Monin; Susana M. Iglesias

doi:10.1117/12.836980

17 June 2009 Study of superficial stress gradients by computer simulation and x-ray diffraction experiment

Joaquim T. Assis, Vladimir I. Monin, Susana M. Iglesias

Proceedings Volume 7377, Twelfth International Workshop on Nanodesign Technology and Computer Simulations; 73770T (2009) https://doi.org/10.1117/12.836980
Event: Nano-Design, Technology, Computer Simulations, 2008, Minsk, Belarus

Abstract

Study of stress gradients is one of the important problems of the X-ray tensometry, especially, in the case of analysis of residual stress state arising after different modern treatments like material modifications by ion beam technologies or surface treatments by laser. These problems related directly with incompleteness of theoretical and experimental measurement techniques with using of X-ray diffraction for study of stress gradients and they are connected with nonlinear character of dependency of diffraction angle θ_φ,_ψ versus sin²ψ and with broadening of diffraction line caused by surface stress gradient. Computer simulation gives possibility to resolve the problem of determination of stress state characterized by strong gradient. The objective of presented paper is to develop a methodology of determination of stress gradient parameters. The methodology is based on computer simulation of diffraction line and permits to make corrections of stress measurements made by diffraction sin²ψ-method.

Citation Download Citation

Joaquim T. Assis, Vladimir I. Monin, and Susana M. Iglesias "Study of superficial stress gradients by computer simulation and x-ray diffraction experiment", Proc. SPIE 7377, Twelfth International Workshop on Nanodesign Technology and Computer Simulations, 73770T (17 June 2009); https://doi.org/10.1117/12.836980

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