Paper
21 August 2009 Spectral effects of AFM tip geometry
Author Affiliations +
Abstract
It is known that tactile measurement systems like AFM, besides their resolution limit in spatial frequency, introduce distortions in the measured surface functions. Usually the distortion process is described by morphological operations, which are also used for reconstruction approaches. These operations do not deliver analytical information on the spectral consequences of the distortion process. Since the measurement and signal chain are time dependent systems and the signal processing is often based on time resp. spatial frequency analysis, such analytical estimations are highly desirable. The paper describes a method to characterize the distortion process in the spectral domain, leading to a spectral description of the resulting signal. The presented approach is neither based on morphological image processing nor convolution and can be utilized to determine the obtainable quality of AFM measurements and the limits of surface reconstruction.
© (2009) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Cornelius Hahlweg and Hendrik Rothe "Spectral effects of AFM tip geometry", Proc. SPIE 7405, Instrumentation, Metrology, and Standards for Nanomanufacturing III, 74050I (21 August 2009); https://doi.org/10.1117/12.826835
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Atomic force microscopy

Convolution

Signal processing

Image processing

Spherical lenses

Spatial frequencies

Statistical analysis

RELATED CONTENT

Refined measurement of digital image texture loss
Proceedings of SPIE (February 04 2013)
Perceptually lossy compression of documents
Proceedings of SPIE (June 03 1997)
How small should pixel size be?
Proceedings of SPIE (May 15 2000)
Image fusion based on surface model
Proceedings of SPIE (January 04 2006)
Simplified method of estimating noise-power spectra
Proceedings of SPIE (July 24 1998)

Back to Top