Practical method for measurement of AC-driven LEDs at a given junction temperature by using active heat sinks

Yuqin Zong; Pei-Ting Chou; Ming-Te Lin; Yoshi Ohno

doi:10.1117/12.826743

18 August 2009 Practical method for measurement of AC-driven LEDs at a given junction temperature by using active heat sinks

Yuqin Zong, Pei-Ting Chou, Ming-Te Lin, Yoshi Ohno

Author Affiliations +

Proceedings Volume 7422, Ninth International Conference on Solid State Lighting; 742208 (2009) https://doi.org/10.1117/12.826743
Event: SPIE Optical Engineering + Applications, 2009, San Diego, California, United States

Abstract

Alternating-current (AC) driven high-power light-emitting diodes (LEDs) have become available and introduced into solid-state lighting (SSL) products. AC LEDs operate directly from a mains supply with no need of drivers, and thus can simplify the design of SSL product and potentially increase product's reliability and lifetime. Similar to direct-current (DC) LEDs the optical and electrical properties of AC LEDs are strongly dependent on the LED junction temperature. In addition, the instantaneous junction temperature of an AC LED changes rapidly within an AC power cycle. Accurate measurement of AC high-power LEDs is required for quality control and product qualifications such as the US Energy Star. We have developed a simple, robust method for measurement of high-power AC LEDs at any specified junction temperature under a normal AC operating condition. An active heat sink is used for setting and controlling the junction temperature of the test AC LED. By using this measurement technique, the measurement of an AC LED also obtains the thermal resistance between the LED junction and the LED heat sink.

Citation Download Citation

Yuqin Zong, Pei-Ting Chou, Ming-Te Lin, and Yoshi Ohno "Practical method for measurement of AC-driven LEDs at a given junction temperature by using active heat sinks", Proc. SPIE 7422, Ninth International Conference on Solid State Lighting, 742208 (18 August 2009); https://doi.org/10.1117/12.826743

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available