Near-infrared spectroscopy and pattern recognition techniques applied to the identification of Jinhua ham

Honglian Li; Zhilei Zhao; Yanping Pang; Yanfeng Wang; Xiaoting Li

doi:10.1117/12.843357

30 November 2009 Near-infrared spectroscopy and pattern recognition techniques applied to the identification of Jinhua ham

Honglian Li, Zhilei Zhao, Yanping Pang, Yanfeng Wang, Xiaoting Li

Author Affiliations +

Proceedings Volume 7506, 2009 International Conference on Optical Instruments and Technology: Optical Systems and Modern Optoelectronic Instruments; 750612 (2009) https://doi.org/10.1117/12.843357
Event: International Conference on Optical Instrumentation and Technology, 2009, Shanghai, China

Abstract

Near-infrared (NIR) diffuse reflectance spectroscopy and pattern recognition techniques are applied to develop a fast identification method of Jinhua ham. The samples are collected from different manufactures and they are nineteen Jinhua ham samples and four Xuanwei ham samples. NIR spectra are pretreated with second derivative calculation and vector normalization. The pattern recognition techniques which are cluster analysis, conformity test and principal component analysis (PCA) are separately used to qualify Jinhua ham. The three methods can all distinguish Jinhua ham successfully. The result indicated that a 100 % recognition ration is achieved by the methods and the PCA method is the best one. Overall, NIR reflectance spectroscopy using pattern recognition is shown to have significant potential as a rapid and accurate method for identification of ham.

Citation Download Citation

Honglian Li, Zhilei Zhao, Yanping Pang, Yanfeng Wang, and Xiaoting Li "Near-infrared spectroscopy and pattern recognition techniques applied to the identification of Jinhua ham", Proc. SPIE 7506, 2009 International Conference on Optical Instruments and Technology: Optical Systems and Modern Optoelectronic Instruments, 750612 (30 November 2009); https://doi.org/10.1117/12.843357

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