A semi-automatic 3D laser scan system design

Hanwei Xiong; Ming Pan; Xiangwei Zhang

doi:10.1117/12.838217

24 November 2009 A semi-automatic 3D laser scan system design

Hanwei Xiong, Ming Pan, Xiangwei Zhang

Proceedings Volume 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology; 75132K (2009) https://doi.org/10.1117/12.838217
Event: International Conference on Optical Instrumentation and Technology, 2009, Shanghai, China

Abstract

Digital 3D models are now used everywhere, from traditional fields of industrial design, artistic design, to heritage conservation. Although laser scan is very useful to get densely samples of the objects, nowadays, such an instrument is expensive and always need to be connected to a computer with stable power supply, which prevent it from usage for fieldworks. In this paper, a new semi-automatic 3D laser scan method is proposed using two line laser sources. The planes projected from the laser sources are orthogonal, one of which is fixed relative to the camera, and the other can be rotated along a settled axis. Before scanning, the system must be calibrated, from which the parameters of the camera, the position of the fixed laser plane and the settled axis are introduced. In scanning process, the fixed laser plane and the camera form a conventional structured light system, and the 3d positions of the intersection curves of the fixed laser plane with the object can be computed. The other laser plane is rotated manually or mechanically, and its position can be determined from the cross point intersecting with the fixed laser plane on the object, so the coordinates of sweeping points can be obtained. The new system can be used without a computer (The data can be processed later), which make it suitable for fieldworks. A scanning case is given in the end.

Citation Download Citation

Hanwei Xiong, Ming Pan, and Xiangwei Zhang "A semi-automatic 3D laser scan system design", Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 75132K (24 November 2009); https://doi.org/10.1117/12.838217

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