Polarization-interferometric nonlinear confocal microscopy for measuring nano-sized objects

Chikara Egami; Hironori Tanaka; Haruyuki Murakami; Satoshi Ota

doi:10.1117/12.850975

14 April 2010 Polarization-interferometric nonlinear confocal microscopy for measuring nano-sized objects

Chikara Egami, Hironori Tanaka, Haruyuki Murakami, Satoshi Ota

Proceedings Volume 7522, Fourth International Conference on Experimental Mechanics; 75225G (2010) https://doi.org/10.1117/12.850975
Event: Fourth International Conference on Experimental Mechanics, 2009, Singapore, Singapore

Abstract

Polarization-interferometric nonlinear confocal microscopy is proposed for measuring a nano-sized object (such as nano particle) with lower linear absortion. A three-dimensional distribution of third-order nonlinear dielectric polarization was observed.

Citation Download Citation

Chikara Egami, Hironori Tanaka, Haruyuki Murakami, and Satoshi Ota "Polarization-interferometric nonlinear confocal microscopy for measuring nano-sized objects", Proc. SPIE 7522, Fourth International Conference on Experimental Mechanics, 75225G (14 April 2010); https://doi.org/10.1117/12.850975

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