Paper
25 January 2010 A 2.2M CMOS image sensor for high-speed machine vision applications
Xinyang Wang, Jan Bogaerts, Guido Vanhorebeek, Koen Ruythoren, Bart Ceulemans, Gérald Lepage, Pieter Willems, Guy Meynants
Author Affiliations +
Proceedings Volume 7536, Sensors, Cameras, and Systems for Industrial/Scientific Applications XI; 75360M (2010) https://doi.org/10.1117/12.838880
Event: IS&T/SPIE Electronic Imaging, 2010, San Jose, California, United States
Abstract
This paper describes a 2.2 Megapixel CMOS image sensor made in 0.18 μm CMOS process for high-speed machine vision applications. The sensor runs at 340 fps with digital output using 16 LVDS channels at 480MHz. The pixel array counts 2048x1088 pixels with a 5.5um pitch. The unique pixel architecture supports a true correlated double sampling, thus yields a noise level as low as 13 e- and a pixel parasitic light sensitivity (PLS) of 1/60 000. The sensitivity of the sensor is measured to be 4.64 Vlux.s and the pixel full well charge is 18k e-.
© (2010) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Xinyang Wang, Jan Bogaerts, Guido Vanhorebeek, Koen Ruythoren, Bart Ceulemans, Gérald Lepage, Pieter Willems, and Guy Meynants "A 2.2M CMOS image sensor for high-speed machine vision applications", Proc. SPIE 7536, Sensors, Cameras, and Systems for Industrial/Scientific Applications XI, 75360M (25 January 2010); https://doi.org/10.1117/12.838880
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Cited by 14 scholarly publications.
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KEYWORDS
Sensors

Transistors

Interference (communication)

CMOS sensors

Amplifiers

Cadmium sulfide

Image processing

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