Paper
28 December 2010 Design of co-path scanning long trace profiler for measurement of x-ray space optical elements
Li Shun, Gong Yan, Zhang Wei, Zhao Yang
Author Affiliations +
Proceedings Volume 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation; 754421 (2010) https://doi.org/10.1117/12.885415
Event: Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 2010, Hangzhou, China
Abstract
The Long Trace Profiler (LTP) is a precision surface slope error measurement instrument used in synchrotron radiation optics for many years. By making some modifications to the LTP system, we developed a co-path scanning LTP (CSLTP) system to test the cylindrical aspherical surface which used in X-ray space optics. To reduce the mistake caused by air turbulence and manufacture faults of optical elements used, the CSLTP is designed with the least difference between the testing beam path and the reference beam path. Also, it uses multiple-beam interference but double beam interference to reduce the width of beam fringe. This improves the position precision of the beam fringe on the image plane.
© (2010) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Li Shun, Gong Yan, Zhang Wei, and Zhao Yang "Design of co-path scanning long trace profiler for measurement of x-ray space optical elements", Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 754421 (28 December 2010); https://doi.org/10.1117/12.885415
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KEYWORDS
Fourier transforms

X-ray optics

X-rays

Astronomical imaging

Beam splitters

Modulators

Optical components

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