Paper
17 August 2010 Organic n-channel thin film transistors based on dichlorinated naphthalene diimides
M. Stolte, S.-L. Suraru, F. Würthner, J. H. Oh, Z. Bao, J. Brill, M. Könemann, J. Qu, U. Zschieschang, H. Klauck
Author Affiliations +
Abstract
Five core-dichlorinated naphthalene diimides (NDIs) bearing several fluoroalkyl-substituents at the imide nitrogens were synthesized, characterized and employed in organic n-channel thin-film transistors with a vacuum-deposited semiconductor layer on 110 nm thick SiO2 (100 nm)/AlOx (8 nm)/SAM (1.7 nm) and 5.7 nm thick AlOx (3.6 nm)/SAM (2.1 nm) gate dielectrics. The electron mobility of the thin-film transistors under ambient conditions is as large as 1.3 cm2/Vs on the thicker gate dielectric. On the thinner gate dielectric the mobility is lower (0.4 cm2/Vs) but enables switching at gate-source voltages of only 3V. Such outstanding performance together with the feasible synthetic access to these compounds make these semiconductors highly promising for low-cost, large-area, and flexible electronics.
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M. Stolte, S.-L. Suraru, F. Würthner, J. H. Oh, Z. Bao, J. Brill, M. Könemann, J. Qu, U. Zschieschang, and H. Klauck "Organic n-channel thin film transistors based on dichlorinated naphthalene diimides", Proc. SPIE 7778, Organic Field-Effect Transistors IX, 777804 (17 August 2010); https://doi.org/10.1117/12.859829
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Cited by 11 scholarly publications and 2 patents.
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KEYWORDS
Dielectrics

Semiconductors

Transistors

Thin films

Organic semiconductors

Silica

Gold

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