Terahertz wave opto-mechanical scanner for security application

Chao Deng; Yongju Zheng; Cunlin Zhang

doi:10.1117/12.870519

4 November 2010 Terahertz wave opto-mechanical scanner for security application

Chao Deng, Yongju Zheng, Cunlin Zhang

Proceedings Volume 7854, Infrared, Millimeter Wave, and Terahertz Technologies; 78541R (2010) https://doi.org/10.1117/12.870519
Event: Photonics Asia 2010, 2010, Beijing, China

Abstract

This paper describes a new opto-mechanical scanner that is hopeful for terahertz imaging in security applications. The target of using this scanner is portal screening of personnel for high-resolution imaging of concealed threat objects. It is not only applied to active terahertz imaging but also applied to passive Terahertz imaging. Terahertz wave can penetrate many materials that are opaque to visible and infrared light, such as plastics, cardboard, textiles and so on. So the terahertz imaging technology has a potential to be applicable in security inspection at airports, stations and other public place. Now, the most terahertz imaging system works at point to point mechanical scan pattern. The speed of this raster scan is too slow to apply in practical field. 2-D terahertz array detector can be applied to real time imaging. But at present their cost is prohibitively high. Fortunately low cost, high performance, opto-mechanically scanner is able to meet the current requirements. An opto-mechanical scanner should be able to rapidly scan a 2-D image of the scene. It also should have high optical efficiency so that an image system can achieve the required thermal sensitivity with the minimum number of receivers. These ensure that it can easily operate at any wavelength, and be active or passive. The opto-mechanically scanning can meets these requirements and is being developed into a high performance, low-cost prototype system that will meet the future needs for terahertz security.

Citation Download Citation

Chao Deng, Yongju Zheng, and Cunlin Zhang "Terahertz wave opto-mechanical scanner for security application", Proc. SPIE 7854, Infrared, Millimeter Wave, and Terahertz Technologies, 78541R (4 November 2010); https://doi.org/10.1117/12.870519

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members: $17.00

Non-members: $21.00 ADD TO CART

PROCEEDINGS
7 PAGES

DOWNLOAD PAPER SAVE TO MY LIBRARY

GET CITATION

RIGHTS & PERMISSIONS

Get copyright permission Get copyright permission on Copyright Marketplace

KEYWORDS

Scanners

Mirrors

Terahertz radiation

Millimeter wave imaging

Aluminum

Imaging systems

Digital image processing

Show All Keywords

Keywords/Phrases

Search In:

Publication Years