Micrometric measurement of thermally induced efforts using digital holographic interferometry

Freddy Monroy; J. Garcia-Sucerquia

doi:10.1117/12.903408

2 November 2011 Micrometric measurement of thermally induced efforts using digital holographic interferometry

Freddy Monroy, J. Garcia-Sucerquia

Proceedings Volume 8011, 22nd Congress of the International Commission for Optics: Light for the Development of the World; 801182 (2011) https://doi.org/10.1117/12.903408
Event: International Commission for Optics (ICO 22), 2011, Puebla, Mexico

Abstract

The change of temperature of an object introduces variation of the objects dimensions. These dimensional changes that are in the micrometer scale, can have undesired consequences as for example the decoupling of soldering points in electronic circuits. In this work we present a system based on digital interferometry to quantify the dimensional change induced on an electronic circuit board as it operates. In digital holographic interferometry of double exposure two holograms of the object are registered for different temperatures. The holograms are registered by a solid state detector and transferred to a computer; thereafter the recordings are reconstructed numerically using Fresnel's approximation. The amplitude and the phase of the complex optical field reflected by the object can be recovered. The resulting phase map is converted into micrometer dimensional variations by means of a lookup table generated previously. The lookup table is computed by calibrating phase maps obtained when known mechanical displacements are introduced over an object. We present experimental results of deformations in the range of 0, 5 μm to 4 μm for a regular circuit board.

Citation Download Citation

Freddy Monroy and J. Garcia-Sucerquia "Micrometric measurement of thermally induced efforts using digital holographic interferometry", Proc. SPIE 8011, 22nd Congress of the International Commission for Optics: Light for the Development of the World, 801182 (2 November 2011); https://doi.org/10.1117/12.903408

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members: $17.00

Non-members: $21.00 ADD TO CART

PROCEEDINGS
8 PAGES

DOWNLOAD PAPER SAVE TO MY LIBRARY

GET CITATION

RIGHTS & PERMISSIONS

Get copyright permission Get copyright permission on Copyright Marketplace

KEYWORDS

Holograms

Digital holography

Holographic interferometry

Interferometry

Temperature metrology

Wavefronts

Electronic circuits

Show All Keywords

Keywords/Phrases

Search In:

Publication Years