Paper
20 May 2011 HOT infrared detectors using MCT technology
Michel Vuillermet, Laurent Rubaldo, Fabien Chabuel, Christophe Pautet, Jean Christophe Terme, Laurent Mollard, Johan Rothman, Nicolas Baier
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Abstract
Cooled IR technologies are challenged for answering new system needs like the reduction of power consumption. This reduction is requested in new IR system design in particular for cooled IR detection. The goal is to reduce system sizes, to increase system autonomies and reliabilities and globally to reduce system costs. One of the key drivers for cooled systems is the cooler and the operating temperature. As far as operating temperature is concerned, Sofradir and CEALETI LIR put a lot of efforts to increase the operating temperature of IR MCT detectors. The n/p and p/n MCT technologies are improved to operate at high temperature with good performances and particularly with low rate of defective pixels. These detectors operate in the MW blue band, MW and LW. In addition complex structures like nBn structures are developed to go further in the high operating temperature. Results are presented and discussed.
© (2011) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Michel Vuillermet, Laurent Rubaldo, Fabien Chabuel, Christophe Pautet, Jean Christophe Terme, Laurent Mollard, Johan Rothman, and Nicolas Baier "HOT infrared detectors using MCT technology", Proc. SPIE 8012, Infrared Technology and Applications XXXVII, 80122W (20 May 2011); https://doi.org/10.1117/12.885601
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Cited by 8 scholarly publications.
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KEYWORDS
Sensors

Diodes

Medium wave

Staring arrays

Infrared detectors

Interference (communication)

Reliability

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