A mid-infrared prism coupler for bulk and thin film optical analysis

Norman C. Anheier; Hong A. Qiao

doi:10.1117/12.884281

20 May 2011 A mid-infrared prism coupler for bulk and thin film optical analysis

Norman C. Anheier, Hong A. Qiao

Author Affiliations +

Proceedings Volume 8016, Window and Dome Technologies and Materials XII; 80160E (2011) https://doi.org/10.1117/12.884281
Event: SPIE Defense, Security, and Sensing, 2011, Orlando, Florida, United States

Abstract

In this paper we present a prism coupler that is capable of characterizing optical dispersion and thermal index variations (dn/dT) in bulk and thin film materials at measurement wavelengths extending through the mid-infrared (3 to 12 μm). Our research was motivated by the need for precise, rapid, and low cost optical refractive index analysis to facilitate development of new mid-infrared optical materials, assessment of variability in mid-infrared optical materials acquired from commercial sources, and design of optical elements used in advanced, high performance mid-infrared sensing platforms. Such efforts commonly require ±1x10^-3 or better absolute index measurement accuracy at measurement wavelengths spanning from the visible to the mid-infrared. Unfortunately most dispersion and dn/dT characterization methods require compromises in accuracy, cost, and timeliness, or cannot access the mid-infrared spectral region where many of the most important sensing and defense applications exist. A prism coupler, implemented at the mid-infrared, was found to provide rapid and cost-effective optical materials metrology with sufficient accuracy to meet most design requirements. We discuss the challenges of integrating the required mid-infrared optical components, including a sensitive mid-infrared detector and the quantum cascade and other infrared laser sources, with a commercial Metricon prism coupler and the calibration steps necessary to achieve the desired measurement accuracy.

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Norman C. Anheier and Hong A. Qiao "A mid-infrared prism coupler for bulk and thin film optical analysis", Proc. SPIE 8016, Window and Dome Technologies and Materials XII, 80160E (20 May 2011); https://doi.org/10.1117/12.884281

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