Characterization of photon-counting detector responsivity for nonlinear two-photon absorption process

S. E. Sburlan; W. H. Farr

doi:10.1117/12.884366

12 May 2011 Characterization of photon-counting detector responsivity for nonlinear two-photon absorption process

S. E. Sburlan, W. H. Farr

Proceedings Volume 8033, Advanced Photon Counting Techniques V; 803305 (2011) https://doi.org/10.1117/12.884366
Event: SPIE Defense, Security, and Sensing, 2011, Orlando, Florida, United States

Abstract

Sub-band absorption at 1550 nm has been demonstrated and characterized on silicon Geiger mode detectors, which normally would be expected to have no response at this wavelength. We compare responsivity measurements to single-photon absorption for wavelengths slightly above the band gap wavelength of silicon (~1100 μm). One application for this low efficiency sub-band absorption is in deep space optical communication systems where it is desirable to track a 1030 nm uplink beacon on the same flight terminal detector array that monitors a 1550 nm downlink signal for pointing control. The currently observed absorption at 1550 nm provides 60-70 dB of isolation compared to the response at 1064 nm, which is desirable to avoid saturation of the detector by scattered light from the downlink laser.

Citation Download Citation

S. E. Sburlan and W. H. Farr "Characterization of photon-counting detector responsivity for nonlinear two-photon absorption process", Proc. SPIE 8033, Advanced Photon Counting Techniques V, 803305 (12 May 2011); https://doi.org/10.1117/12.884366

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