Interferoketric Measurements Of Nonl1Nearities In Planar Optical Waveguides Deposited On Cd(S, Se) Doped Glasses

S. Patela; H. Jercminek; Z. Jazubczyl; C. Delisle; R. Tremblay

doi:10.1117/12.967206

1 January 1987 Interferoketric Measurements Of Nonl1Nearities In Planar Optical Waveguides Deposited On Cd(S, Se) Doped Glasses

S. Patela, H. Jercminek, Z. Jazubczyl, C. Delisle, R. Tremblay

Author Affiliations +

Proceedings Volume 0813, Optics and the Information Age; (1987) https://doi.org/10.1117/12.967206
Event: 14th Congress of the International Commission for Optics, 1987, Quebec, Canada

Abstract

A high light intensity is an inherent feature of integrated optics waveguides. A beam dimensions can be easily reduced hundred times or more, with the appropriate change in beam intensity. Integrated optic structures with high light intensities are particularly well suited for nonlinear optical experiments.

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S. Patela, H. Jercminek, Z. Jazubczyl, C. Delisle, and R. Tremblay "Interferoketric Measurements Of Nonl1Nearities In Planar Optical Waveguides Deposited On Cd(S, Se) Doped Glasses", Proc. SPIE 0813, Optics and the Information Age, (1 January 1987); https://doi.org/10.1117/12.967206

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