Paper
1 January 1987 Phase Visualization Of Diffraction Patterns And Its Application
Motoki Yonemura
Author Affiliations +
Proceedings Volume 0813, Optics and the Information Age; (1987) https://doi.org/10.1117/12.967322
Event: 14th Congress of the International Commission for Optics, 1987, Quebec, Canada
Abstract
In non-contact particle characterization in-line holography has played an important role. There are two methods for obtaining the information of particles, one is the optical reconstruction of real images and another is the calculation from the photographic recording of diffraction patterns. In the former, errors are introduced by focusing error, the nonlinearity of the recording media, aberration, etc. In the latter, from the diffraction patterns containing shape, size and position information it is difficult to extract each separately and the accurate measurement of light intensity data from the photographic record of diffraction patterns is also difficult.
© (1987) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Motoki Yonemura "Phase Visualization Of Diffraction Patterns And Its Application", Proc. SPIE 0813, Optics and the Information Age, (1 January 1987); https://doi.org/10.1117/12.967322
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KEYWORDS
Diffraction

Particles

Image processing

Visualization

Image sensors

Photography

Holography

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