Paper
27 September 2011 Comparison of SEM and optical analysis of DT neutron tracks in CR-39 detectors
P. A. Mosier-Boss, L. P. G. Forsley, P. Carbonnelle, M. S. Morey, J. R. Tinsley, J. P. Hurley, F. E. Gordon
Author Affiliations +
Abstract
CR-39 detectors were exposed to DT neutrons generated by a Thermo Fisher model A290 neutron generator. Afterwards, the etched tracks were examined both optically and by scanning electron microscopy (SEM). The purpose of the analysis was to compare the two techniques and to determine whether additional information on track geometry could be obtained by SEM analysis. The use of these techniques to examine triple tracks, diagnostic of ≥9.6 MeV neutrons, observed in CR-39 used in Pd/D co-deposition experiments will also be discussed.
© (2011) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
P. A. Mosier-Boss, L. P. G. Forsley, P. Carbonnelle, M. S. Morey, J. R. Tinsley, J. P. Hurley, and F. E. Gordon "Comparison of SEM and optical analysis of DT neutron tracks in CR-39 detectors", Proc. SPIE 8142, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XIII, 81420K (27 September 2011); https://doi.org/10.1117/12.896953
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KEYWORDS
Optical tracking

Sensors

Scanning electron microscopy

Etching

Carbon

Photomicroscopy

Charged particle optics

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