Advanced Wavefront Sensing At Lockheed

Osuk Y Kwon

doi:10.1117/12.941766

23 March 1987 Advanced Wavefront Sensing At Lockheed

Osuk Y Kwon

Proceedings Volume 0816, Interferometric Metrology; (1987) https://doi.org/10.1117/12.941766
Event: 31st Annual Technical Symposium on Optical and Optoelectronic Applied Sciences and Engineering, 1987, San Diego, CA, United States

Abstract

During recent years, Lockheed has been researching and developing many of the key optical technologies required by modern optical systems for military and civil space programs. This paper summarizes recent progress made in interferometry as a tool for wavefront sensing in beam control and diagnostics and other precision optical metrology. The areas include: (1) optical design, modeling, and analysis of interferometers; (2) computer-assisted opto-mechanical design and layout; (3) real-time interferometry by digital heterodyne and phase-shifting techniques for various applications; and (4) data processing algorithms.

Citation Download Citation

Osuk Y Kwon "Advanced Wavefront Sensing At Lockheed", Proc. SPIE 0816, Interferometric Metrology, (23 March 1987); https://doi.org/10.1117/12.941766

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