Evaluation of the single-frequency operation of a short vertical external-cavity semiconductor laser at 852 nm

Fabiola A. Camargo; Sylvie Janicot; Isabelle Sagnes; Arnaud Garnache; Patrick Georges; Gaëlle Lucas-Leclin

doi:10.1117/12.908738

15 February 2012 Evaluation of the single-frequency operation of a short vertical external-cavity semiconductor laser at 852 nm

Fabiola A. Camargo, Sylvie Janicot, Isabelle Sagnes, Arnaud Garnache, Patrick Georges, Gaëlle Lucas-Leclin

Author Affiliations +

Proceedings Volume 8242, Vertical External Cavity Surface Emitting Lasers (VECSELs) II; 82420F (2012) https://doi.org/10.1117/12.908738
Event: SPIE LASE, 2012, San Francisco, California, United States

Abstract

We present in this work the study of a short vertical external cavity semiconductor laser in single longitudinal operation at 852 nm without intracavity elements. Two different configurations were studied, a plane-plane configuration, stabilized by the thermal lens and a plane-concave configuration. The influence of the output coupler transmission and the thermal lens has been studied. In the plane concave configuration we have demonstrated more than 100mW in stable single frequency operation using a very compact cavity emitting around 852 nm.

Citation Download Citation

Fabiola A. Camargo, Sylvie Janicot, Isabelle Sagnes, Arnaud Garnache, Patrick Georges, and Gaëlle Lucas-Leclin "Evaluation of the single-frequency operation of a short vertical external-cavity semiconductor laser at 852 nm", Proc. SPIE 8242, Vertical External Cavity Surface Emitting Lasers (VECSELs) II, 82420F (15 February 2012); https://doi.org/10.1117/12.908738

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