Paper
14 October 2011 Corrosion process of copper in chloride solution by optical interferometry
Guadalupe Yanett Enciso Soto, José Antonio Marbán Salgado, Oscar Sarmiento Martinez, Jorge Uruchurtu Chavarín, Darwin Mayorga Cruz
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Proceedings Volume 8287, Eighth Symposium Optics in Industry; 82870A (2011) https://doi.org/10.1117/12.910722
Event: Eighth Symposium Optics in Industry, 2011, Toluca de Lerdo, Mexico
Abstract
Holographic interferometry-based methods represent an interesting innovation for monitoring electrochemical corrosion processes. One of these techniques based on a Michelson interferometric configuration allows quantitative and qualitative obtaining of information related to corrosion, being based on simple inspection of intensity patterns with no direct physical contact with sample during reaction time, and physical preservation practically guaranteed. In this work the performance of Michelson interferometry for investigation of such phenomena on uncovered, partial and totally covered copper metallic samples is presented and experimental results suggest important information gathered about the type and mechanism of corrosion taking place.
© (2011) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Guadalupe Yanett Enciso Soto, José Antonio Marbán Salgado, Oscar Sarmiento Martinez, Jorge Uruchurtu Chavarín, and Darwin Mayorga Cruz "Corrosion process of copper in chloride solution by optical interferometry", Proc. SPIE 8287, Eighth Symposium Optics in Industry, 82870A (14 October 2011); https://doi.org/10.1117/12.910722
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KEYWORDS
Corrosion

Copper

Interferometry

Electrodes

Optical interferometry

Oxides

Metals

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