Paper
29 June 2012 A perspective on collaborative research for emerging technologies and design
Author Affiliations +
Abstract
A perspective is given using student projects on how university research can be an important resource for the highly advanced and sophisticated photomask industry. The collaborative and cross-discipline nature of innovation in the IC industry naturally leads to win-win relationships. Specific examples are given of successful collaborative research projects from the University of California consortium "Integrated Modeling Process and Computation for Technology" (IMPACT). The examples include research on lithography and inspection, devices, statistical characterization, and Design-for-Manufacturing frameworks for multiple-patterning and EUV. The paper concludes with a perspective on future opportunities, challenges and plans. The technical details of the student projects were published but not presented in connection with Photomask Japan 2011 (SPIE Proc. 8081).
© (2012) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Andrew R. Neureuther "A perspective on collaborative research for emerging technologies and design", Proc. SPIE 8441, Photomask and Next-Generation Lithography Mask Technology XIX, 84410G (29 June 2012); https://doi.org/10.1117/12.970297
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KEYWORDS
Photomasks

Semiconductor manufacturing

Data modeling

Extreme ultraviolet

Inspection

Manufacturing

Process modeling

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