Paper
17 September 2012 Development of bent crystal for imaging polarimetry
Kota Okada, Takashi Awaya, Yohko Tsuboi, Ryo Iizuka, Naoto Ohtake
Author Affiliations +
Abstract
We are developing a Bragg crystal polarimeter which has high modulation factor. The point we aim is to bend the crystal; by using bent crystal, we can reflect X-ray emission with broadened energy width, focus it on a small detector, which increases S/N ratio, and obtain imaging capability. We bent Si (100) crystal sheets by depositing Diamond-Like Carbon (DLC) on the backside of reflection surface. They are bent by the residual stress between the DLC and crystal. We can control the curvature by changing the DLC thickness. The angular reflectivity was measured with the line emission at 8.04 keV (Cu-Kα). We confirmed that the angular width is broadened to 1 degree, which is equivalent to the energy width of 0.5 keV. The integrated reflectivity becomes larger, as the curvature radius of crystal becomes small. The modulation factor of bent Si is 0.74, which is higher than that of the flat Si of 0.51. Having the wide energy band with the high modulation factor, the bent Si crystal can be a new tool for the X-ray polarimeter. We have also made the bent Ge(111) crystal and measured the same performances. The modulation factor of both the flat and the bent Ge were 0.99 , when using the 8.04 keV (Cu-Kα) beam, as we expected. This means that by choosing crystals, we can make efficient observations with aimed energy band. We report the status of our development.
© (2012) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Kota Okada, Takashi Awaya, Yohko Tsuboi, Ryo Iizuka, and Naoto Ohtake "Development of bent crystal for imaging polarimetry", Proc. SPIE 8443, Space Telescopes and Instrumentation 2012: Ultraviolet to Gamma Ray, 84434L (17 September 2012); https://doi.org/10.1117/12.926053
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KEYWORDS
Crystals

X-rays

Silicon

Modulation

Polarimetry

Reflectivity

Germanium

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