Imaging of short time microscopic scenes with strong light emission: revisited

Cornelius Hahlweg; Wenjing Zhao; Hendrik Vogeler; Hendrik Rothe

doi:10.1117/12.929577

11 October 2012 Imaging of short time microscopic scenes with strong light emission: revisited

Cornelius Hahlweg, Wenjing Zhao, Hendrik Vogeler, Hendrik Rothe

Proceedings Volume 8466, Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VI; 84660K (2012) https://doi.org/10.1117/12.929577
Event: SPIE NanoScience + Engineering, 2012, San Diego, California, United States

Abstract

In last year’s session we presented some experimental results from investigations on microscopic scenes with strong light emission such as exploding wires, for which we used laser based shadow imaging methods. The present paper is understood as a continuation in two branches. First, we’d like to discuss the fourier optical properties of shadow imaging in comparison with the imaging of the object itself and its far field, showing that the shadowgraph is the link between imaging the real object and scatterometry. Second, we present investigations on gathering high dynamic range short images of short time processes using a completely different approach based on luminescent screens, delivering a decaying image of naturally high dynamic range, which - during decay time- might be converted to a series of single images under adapted conditions.

Citation Download Citation

Cornelius Hahlweg, Wenjing Zhao, Hendrik Vogeler, and Hendrik Rothe "Imaging of short time microscopic scenes with strong light emission: revisited", Proc. SPIE 8466, Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VI, 84660K (11 October 2012); https://doi.org/10.1117/12.929577

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